Xenocs designs and manufactures laboratory X-ray scattering instruments and software for nanoscale characterization: small- and wide-angle scattering (SAXS/WAXS), grazing incidence (GISAXS), ultra-small-angle scattering (USAXS) and X-ray imaging.
Malva represents Xenocs in Greece and Cyprus, with local sales, installation, application support and service by our own engineers.
The Ultimate Solution for Nanoscale Characterization using SAXS/WAXS/GISAXS/USAXS/Imaging
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Smart nanoscale characterization with ease of use and high performance in a compact, intelligent design
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X-ray scattering data processing and analysis.
Learn moreSAXS and WAXS measure size, shape, ordering and interactions directly in solution, powders, gels, films and solids, without labels, staining or crystallization.
More information on Xenocs website: www.xenocs.com
Tell us about your samples and the questions you need to answer. Our application specialists will help you choose the right Xenocs configuration and arrange a demonstration.
