
The Xeuss Pro instrument for nanoscale characterization is the ultimate laboratory SAXS/WAXS/GISAXS/USAXS/Imaging beamline, embodying over a decade of advanced research in Small-Angle X-ray Scattering technology. The Xeuss Pro integrates state-of-the-art advancements to set new standards in X-ray scattering instrumentation.
Designed to offer remarkable versatility and precision, this laboratory SAXS/WAXS/GISAXS/USAXS/Imaging beamline brings atomic- to nano-scale characterization for scientific research to industrial applications alike, directly in your lab.
Key features that set the Xeuss Pro apart include:
More information on Xenocs website: https://www.xenocs.com/solutions/products/xeuss-pro/
Configuration-dependent. Full specifications on the Xenocs website or from Malva.

Ask us for a quotation, an application discussion or a demonstration measurement on your own samples. The Xeuss Pro brochure is available on request: tell us about your research area and we will send it to you.